个人简历

Educational Background
► 09/2012--06/2016, PhD in Statistics, Beijing Institute of Technology. Supervisor: Prof. Yubin Tian. Major: Experimental Design
► 09/2008—06/2010, Master in Statistics, Beijing Institute of Technology. Supervisor: Prof. Yubin Tian. Major: Experimental Design
► 09/2003--07/2007, Bachelor in Statistics, Beijing Institute of Technology.
Working Experience
► 05/2018--Present, Assistant Professor, School of Mathematics and Statistics, Beijing Institute of Technology.
► 07/2016—05/2018, Posdoctor, Academy of Mathematics and Systems Science, Chinese Academy of Sciences. Supervisor: Prof. Dan Yu.
► 09/2011—09/2012, Algorithm Engineer, Alpine data Labs.
► 07/2010—08/2012, Data Analyst, Hua Yuan data analysis co. LTD.
► 07/2007—08/2008, Teaching Assistant, Mathematics experiment center of BIT.

近期论文

Publications
1. Wang, D. P. and Tian, Y. B. (2014). “An Adaptive Design to Assess the Reliability of the Pyrotechnic Control Subsystem in Opening the Solar Array”. Acta Mathematica Application Sinica (English Series), 30, 1037—1048.
2. Wang, D. P., Tian, Y. B. and Xu, Y. (2015). “An Optimal Stochastic Approximation for Estimating the Effective Window of a Control Factor”. Journal of Systems Science and Complexity, 28, 1258—1270.
3. Wang, D. P., Tian, Y. B. and Wu, C. F. Jeff. (2015). “A Skewed version of Robbins-Monro-Joseph Procedure for Binary Response”. Statistica Sinica, 25, 1679—1689.
4. Ba, S., Myers, W. R. and Wang, D. P. (2018). “A Sequential Maximum Projection Design Framework for Computer Experiments with Inert Factors”. Statistica Sinica, 28: 879-897.
5. Wang, D. P., Tian, Y. B. and Wu, C. F. Jeff. (2020) “Comprehensive Comparisons of Major Procedures for Sensitivity Testing”. Journal of Quality Technology, 52(2): 155-167.
6. Joseph, R. V., Wang, D. P., Li, G., Lv, S. J. and Tuo, R.(2019). “Deterministic Sampling of Expensive Posteriors Using Minimum Energy Designs”. Technometrics, 61(3): 297-308.
7. Li Jialu#; Tian Yubin#; Wang Dianpeng* (2020). Change-point detection of failure mechanism for electronic devices based on Arrhenius model, Applied Mathematical Modelling, 2020, 83: 46-58.