个人简历

商广义，教授、博导，物理学院光学学科责任教授，学院学术委员会常委副主任，中国工程院中国信息与电子工程科技发展战略研究中心专家委员会特聘专家，北京光学学会理事，中国科学院纳米标准与检测重点实验室学术委员会委员等。承担“专业物理实验方法”、“现代光学导论”等本科生课程，主讲校级“高新技术中的物理学基础”、“现代光学基础”、以及“博士生综合课”等研究生课程。长期从事纳米光学和扫描探针显微学及其应用研究，先后主持国家自然科学基金重点项目、科技部“973”课题、863课题，以及中科院等多项国家和省部级项目，获国家科技进步二等奖1项，省部级科技进步奖3项，申请和获得国家发明专利10余项；与他人合作出版专著1本；在国内外学术期刊上发表论文120多篇。\r
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获奖情况\r
国家科技进步二等奖（1990）\r
中国科学院科技进步三等奖（1995）\r
国家教委科技进步三等奖（1995）

研究领域

纳米光学，主要包括近场光学显微成像与光谱、表面等离激元光子学；\r
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扫描探针显微学及其对锂离子电池电极材料结构/性质的研究""

近期论文

Zhuanfang Bi, JiaxiongWu, Shan Yang, Liu Li, Peifa Yang, Yang Shang,Guangyi Shang*, In situprobing behaviors of single LiNiO2nanoparticles by merging CAFM andAM–FM techniques, Nanoscale, 2018, 10: 2916-2922.\r
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Zhuanfang Bi, Mu Yang, Yang Shang, Xiaoxia Meng, Hao Zhang,Guangyi Shang*, Polarization-dependent hotspots formed in crossed silver nanowires for surface-enhanced Raman spectroscopy, Opt. Commun., 2018, 429: 35–40.\r
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Zhuanfang Bi, Wei Cai, Yingjie Wang,Guangyi Shang*, Direct manipulation of metallic nanosheets by shear force microscopy, Journal of Microscopy, 2018, 271(2): 222–229.\r
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Zhuan-Fang Bi, Mu Yang, andGuang-Yi Shang*, Optical polarization response at gold nanosheet edges probed by scanning near-?eld optical microscopy,Chin. Phys. B, 2018, 27(8): 087801.\r
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Jiaxiong Wu, Shan Yang,Wei Cai, Zhuanfang Bi*,Guangyi Shang*, Junen Yao,Multi-characterization of LiCoO2cathode films using advancedAFM-based techniques with high resolution, Scientific Reports, 2017, 7: 11164.\r
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Wei Cai, Zhengliang Liu,Yan Chen,Guangyi Shang*, A Mini Review of the Key Components used forthe Development of High-Speed Atomic Force Microscopy, Science of AdvancedMaterials, 2017, 9(1): 77-88.\r
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Mu Yang, Wei Cai,Yingjie Wang, Mengtao Sun, Guangyi Shang*, Orientation-andpolarization-dependent optical properties of the single Ag nanowire/glasssubstrate system excited by the evanescent wave, Scientific Reports, 2016, 6:25633.\r
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Jiaxiong Wu，Wei Cai，GuangyiShang*,In situ Electrochemical-AFM Study of LiFePO4Thin Film in Aqueous Electrolyte, Nanoscale Research Letters, 2016,11(1): 1-7.\r
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Lu Xie, Pascal Brault,Anne-Lise Thomann, Xiao Yang, Yong Zhang,GuangYi Shang*, Moleculardynamics simulation of Al-Co-Cr-Cu-Fe-Ni high entropy alloy thin film growth,Intermetallics, 2016, 68: 78-86.\r
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YingjieWang, Wei Cai, Mu Yang, Zhengliang Liu,Guangyi Shang*,Silica-coated silver nanowire-loaded hybrid plasmonicwaveguide for low-loss waveguiding on the nanoscale, Journal ofNanophotonics, 2016, 10(3): 036019.\r
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Ying-jieWang, Wei Cai, Mu Yang, Zheng-liang Liu andGuang-yi Shang*, TheSimulation Study of the Plasmonic Coupling Effect for the AgNanoparticle-nanowire Structure, J. Korean Phys. Soc., 2015,66(2): 261-265.\r
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ei Cai，Mu Yang，Yingjie Wang，GuangyiShang*,Piezoelectric bimorph-based shear force microscopy forthe construction of noble metal plasmonic structures in air, Materials ResearchExpress, 2015, 2(7): 075701.\r
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JiaxiongWu, Wei Cai andGuangyi Shang*, Electrochemical Behavior of LiFePO4Thin Film Prepared by RF Magnetron Sputtering in Li2SO4Aqueous Electrolyte, International Journal of Nanoscience, 2015, 14, 1:1460027.\r
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Wei Cai, JianyongZhao, Weitao Gong, Haiyun Fan,Guangyi Shang*,Resonance-type bimorph-based high-speed atomic force microscopy: real-timeimaging and distortion correction,MeasurementScience and Technology, 2014, 25(12): 125404.\r
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Wei Cai, Haiyun Fan,Jianyong Zhao,Guangyi Shang*，Real-time deflection and friction force imaging bybimorph-based resonance-type high-speed scanning force microscopy in thecontact mode，NanoscaleResearch Letters, 2014, 9(1): 665.\r
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M-L Ma, J Wu, Y-Q Ning,F Zhou, M Yang, X Zhang, J Zhang andG-Y Shang*, Measurement of gaincharacteristics of semiconductor lasers by amplified spontaneous emissions fromdual facets, Opt. Express, 2013, 21(8): 10335.\r
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Jianyong Zhao, WeitaoGong, Wei Cai andGuangyi Shang*, Piezoelectric bimorph-based scanner inthe tip-scan mode for high speed atomic force microscope, Rev. Sci. Instrum.,2013,84: 083706.\r
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Jianyong Zhao, Wei Cai,GuangyiShang*and Junen Yao, Oscillatory Motions of a Cantilever in High-SpeedAtomic Force Microscopy in Constant-Height Mode, Appl. Phys. Express, 2013,6:075201.\r
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Haiyun Fan, Wei Cai,Jianyong Zhao,Guangyi Shang*, A High-Speed Atomic and Friction ForceMicroscopic Imaging System Based on a Novel Optical Beam Deflection Design, 2013IEEE International Conference on Imaging System and Techniques (IST), Beijing,P.R. China, 2013.10.22-10.23.\r
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Wei Cai, Mu Yang,Yingjie Wang, andGuangyi Shang*, Effective Image and Spectral Data AcquisitionMethod Used in Scanning Near-field Optical Microscopy by Bimorph-based ShearForce Sensor, 2013 IEEE International Conference on Imaging System andTechniques (IST), Beijing, P.R. China, 2013.10.22-10.23.\r
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Jianyong Zhao,GuangyiShang*, Weitao Gong, Junen Yao, A novel optical beam deflection detectionsystem based on aspheric lens for high-speed atomic force microscope, Proc. ofSPIE, 2012,8557: 23.\r
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Lijun Xu, Xiangrui Tian,Xiaolu Li,Guangyi Shang*, and Junen Yao, Geometric distortioncorrection for sinusoidally scanned images, Meas. Sci. Technol., 2011,22:114023.\r
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Wei Cai,GuangyiShang*, Yusheng Zhou, Ping Xu, and Jun-en Yao, An alternative flat scannerand micro-positioning method for scanning probe microscope, Rev. Sci. Instrum.,2010,81: 123701.\r
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Yusheng Zhou,GuangyiShang*, Wei Cai, and Junen Yao, Cantilevered bimorph-based scanner for highspeed atomic force microscopy with large scanning range, Rev. Sci. Instrum.,2010,81: 053708.\r
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Wei Cai,GuangyiShang*, and Junen Yao, Local magneto-optical Kerr effect imaging byscanning near-field optical microscopy in reflection-mode, Chin. Opt. Lett.,2010,8(3): 313-315.\r
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G.Y. Shang, W.H. Qiao, F.H. Lei, J-F. Angiboust, M. Troyon, M. Manfait, Development of a shear force scanning near-field fluorescence microscope for biological applications, Ultramicroscopy, 2005, 105: 324-329.\r
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W.H. Qiao,G.Y. Shang, F.H. Lei, A. T. Regnier, J-F. Angiboust, J-M. Millot, M. Manfait, Imaging of P-glycoprotein of H69/VP small-cell lung cancer lines by scanning near-field optical microscopy and confocal laser microspectrofluorometer, Ultramicroscopy, 2005, 105: 330-335.\r
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G.Y. Shang, F.H. Lei, M. Troyon, W.H. Qiao, A. Trussardi-Regnier, M. Manfait, Non-optical bimorph-based tapping-mode force sensing method for scanning near-field optical microscopy, J. Microscopy, 2004, 251(2): 127-130.\r
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F.H. Lei,G.Y. Shang, M. Troyon, M. Spajer, H. Moriani, J.F. Angiboust, M. Manfait, Nanospectrofluorometry inside single living cell scanning near-field optical microscopy, Appl. Phys. Lett., 2001, 79(15): 2489-2491.\r
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G.Y. Shang, C. Wang, J. Wu, C.L. Bai, F.H. Lei, Shera force scanning near-field optical microscope based on a piezoelectric bimorph cantilever, Rev. Sci. Instrum., 2001, 72(5): 2344-2349.\r
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G.Y. Shang, C. Wang, F.H. Lei, C.L. Bai, Surf. Interface Anal., 2001, 32: 289-292.\r
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J. W. Li, C. Wang,G.Y. Shang, Q.M. Xu, Z. Lin, J.J. Guan, C.L. Bai, Friction coefficients derived from apparent height variations in contact mode atomic force microscopy images, Langmuri, 1999, 15: 7662-7669.\r
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C. Wang, G.Y. Shang, X.H. Qiu, C.L. Bai, STM studies of the characteristics of the surface fabrication process using chemical and electrical methods, Appl.Phys.A., 1999, 68: 181-185.\r
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X. H. Qiu,G.Y. Shang, C. Wang, C.L. Bai, Use of ballistic electron emission microscopy to observe the diversity of fabricated nanometer features at the Au/Si interface, Appl. Phys. A, 1998, 66: 91-94.\r
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G. Y. Shang, X. H. Qiu, C. Wang, C. L. Bai, Analysis of lateral force contribution to the topography in contact AFM, Appl. Phys. A, 1998, 66: 333-335.\r
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G.Y. Shang, X. H. Qiu, C. Wang. C. L. Bai, Piezoelectric push-pull micro-positioner for ballistic electron emission microscope, Rev. Sci. Instrum., 1997, 68(10): 3803-3805. X.H. Qiu,G. Y. Shang, C. Wang, N. X. Wang, C. L. Bai, Influence of low energy ballistic electron on the transmittance of An/Si interface studied by ballistic electron emission microscope, Chinese Science Bulletin, 1997, 42(15): 1282-1286.\r
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F. Tian, C. Wang,G.Y. Shang, N.X. Wang, C. L. Bai, Studies of magnetic garnet using magnetic force microscope, J. Magn. Magn. Mat., 1997, 171: 135-140.\r
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C. Wang, X.D. Li,G.Y. Shang, X.H. Qiu, C.L. Bai, Threshold behavior of nanometer scale fabrication process using scanning tunneling microscopy, J. Appl. Phys.,1997, 81(3): 1227-1230.\r
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G.Y. Shang, J.E. Yao, J. He, A new scanning tunneling microscope with large field of view and atomic resolution, J. Vac. Sci. Technol. B, 1991, 9(2): 612-614. J.E. Yao, G.Y. Shang, Y.K. Jiao,Y. Yi, C. L. Bai, J. He, J.C. Zhong, D.N. Rong, A scanning tunneling microscope for operation in air, J. Microscopy, 1988,152(3): 671-674.\r
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马明磊，吴坚*，杨沐，宁永强，商广义，基于两端自发荧光辐射的808nm半导体激光器增益偏振特性实验表征和能带分析,Acta Phys. Sin., 2013,62(17): 174209.。\r
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赵剑勇，蔡微，商广义*，高速原子力显微术研究进展，电子显微学报，2013,32(1):81-89。\r
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李德伟，蔡微，商广义*，朱传凤，姚骏恩，多种形貌纳米银的电化学制备及其表面增强拉曼光谱研究，电子显微学报，2011,30(1):33-38,。\r
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蔡微，商广义*，周瑜升，徐平，姚骏恩，基于三维纳米定位平台的扫描近场光学显微镜，红外与激光工程，2009,38: 347-350。\r
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徐立军，李松云，龚立艳，商广义*，姚骏恩，原子力显微镜图像小波去噪方法的研究，电子显微学报，2009,28(2):135-140。\r
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魏恩浩，徐平，王荣明，商广义*，姚骏恩，聚焦离子束在光纤探针制备技术中的应用，电子显微学报，2009,28(6): 595-599。\r
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朱传凤,商广义,功能新材料及生命体中的微纳结构，科学出版社。