个人简历

浙江大学求是特聘教授、博士生导师，“长江学者”特聘教授，国家杰出青年科学基金获得者。 1999年获得浙江大学工学博士学位，2000-2002年在新加坡Nanyang Technological University从事博士后研究，2002-2003年在新加坡DSO National Laboratories担任Research Scientist，2003 -2005年在日本東北大学担任日本学术振兴会（JSPS）外国人特别研究员、2005-2007年担任该校助理教授，2007年回国工作并晋升为浙江大学机械工程学院教授，2009-2014年担任流体动力与机电系统国家重点实验室副主任。

研究领域

主要研究方向为超精密加工技术、微纳测量以及精密机电系统等。""

近期论文

[1] Zhu W L, Yang S Y, and Ju B –F et al. Scanning tunneling microscopy-based on-machine measurement for diamond fly cutting of micro-structured surfaces. Precision Engineering-Journal of the International Societies for Precision and Nanotechnology, 43: 308-314, 2016\r
[2] Zhu W L, Yang S Y, and Ju B -F* et al. On-machine measurement of a slow slide servo diamond-machined 3D microstructure with a curved substrate. Measurement Science and Technology, 26: 075003, 2015\r
[3] Bai X L, Fang Y M, Lin W, Wang L P, and Ju B -F*. Saliency-based defect detection in industrial images by using phase spectrum. IEEE Transactions on Industrial Informatics, 10: 2135-2145, 2015\r
[4] Sun A Y, Bai X L, and Ju B –F*. A new method for evaluating the degeneration of articular cartilage using pulse-echo ultrasound. Review of Scientific Instruments, 86: 034301, 2015\r
[5] Chen Y -L, Gao W, and Ju B –F*. A measurement method of cutting tool position for relay fabrication of microstructured surface. Measurement Science and Technology, 25: 064018, 2014\r
[6] Chen Y -L, Zhu W L, Yang S Y, and Ju B –F *. Large-area profile measurement of sinusoidal freeform surfaces using a new prototype scanning tunneling microscopy. Precision Engineering, 38: 414-420, 2014\r
[7] Ju B –F *, Zhu W L, Yang S Y, and Yang K J. Scanning tunneling microscopy based in situ measurement of fast tool servo-assisted diamond turning micro-structures. Measurement Science and Technology, 25: 055004, 2014\r
[8] Ju B –F *, Zhu W L, and Yang S Y. Symmetric modulation methodology applied in improving the performance of scanning tunneling microscopy. Review of Scientific Instruments, 84: 126107, 2013\r
[9] Ju B –F *, Bai X L, and Chen J. Design of optimal fast scanning trajectory for the mechanical scanner of measurement instruments. Scanning-The Journal of Scanning Microscopies, 36: 185–193, 2014\r
[10] Bai X L, Su Z Q, Chen J, and Ju B –F * A novel technique for the measurement of the acoustic properties of a thin linear-viscoelastic layer using a planar ultrasonic transducer. Measurement Science and Technology, 24: 125602, 2013\r
[11] Ge Y Z, Zhang W, Chen Y -L, Jin C, and Ju B –F *. A reproducible electropolishing technique to customize tungsten SPM probe: From mathematical modeling to realization. Journal of Materials Processing Technology, 213: 11-19, 2013\r
[12] Chen J, Bai X L, Yang K J, and Ju B –F *. An ultrasonic methodology for determining the mechanical and geometrical properties of a thin layer using a deconvolution technique. Ultrasonics, 53:1377-1383, 2013\r
[13] Ju B –F *, Bai X L, and Chen J. Simultaneous measurement of local longitudinal and transverse wave velocities, attenuation, density, and thickness of films by using point-focus ultrasonic spectroscopy. Journal of Applied Physics, 112: 084910, 2012\r
[14] Ju B –F *, Chen Y -L, Zhang W, Zhu W L, Jin C, and Fang F Z. Long range and accurate measurement of deep trench microstructures by a specialized scanning tunneling microscope. Review of Scientific Instruments, 83: 056106, 2012\r
[15] Ju B –F *, Bai X L, and Chen J. Fast scanning mode and its realization in a scanning acoustic microscope. Review of Scientific Instruments, 83: 035113, 2012\r
[16] Ju B –F *, Chen Y -L, Zhang W, and Fang F Z. Rapid measurement of a high step microstructure with 90° steep sidewall. Review of Scientific Instruments, 83: 013706, 2012\r
[17] Chen J, Bai X L, Yang K J, and Ju B –F *. Angular measurement of acoustic reflection coefficients by the inversion of V(z, t) data with high frequency time-resolved acoustic microscopy. Review of Scientific Instruments, 83: 014901, 2012\r
[18] Jia K, Yang K J, Fan Z W, and Ju B –F *. A contactless methodology of picking up micro-particles from rigid surfaces by acoustic radiation force. Review of Scientific Instruments, 83: 014902, 2012\r
[19] Chen J, Bai X L, Yang K J, and Ju B –F *. The computations of reflection coefficients of multilayer structure based on the reformulation of Thomson-Haskell method. Ultrasonics, 52: 1019–1023, 2012\r
[20] Ju B –F *, Chen Y -L, and Ge Y Z. The art of electrochemical etching for preparing tungsten probes with controllable tip profile and characteristic parameters. Review of Scientific Instruments, 82: 013707, 2011