个人简历

学习工作经历： \r
1986年于中国地质大学（武汉）获工学学士学位； \r
1995年于中国地质大学（武汉）获理学硕士学位； \r
2002年于华中科技大学获工学博士学位； \r
1986年至今在中国地质大学（武汉）任教。

研究领域

无铅压电铁电陶瓷材料； \r
微晶玻璃； \r
多孔陶瓷材料； \r
尾矿综合利用技术； \r
非金属矿深加工技术。""

近期论文

[1] Yanqiu Huang, Haiwei Du, Wei Feng, Haina Qin, Qingbin Hu. Influence of SrZrO3 addition on structural and electrical properties of (K0.45Na0.51Li0.04)(Nb0.90Ta0.04Sb0.06)O3 lead-free piezoelectric ceramics. Journal of Alloys and Compounds, 2014, 590: 435－439.\r
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[2] Haiwei Du, Yanqiu Huang*, Hongping Tang, Wei Feng, Haina Qin, Xiufang Lu. Structure and electrical properties of [(K0.49Na0.51)1-xLix](Nb0.90Ta0.04Sb0.06)O3 lead-free piezoceramics. Ceramics International, 2013, 2013, 39: 5689－5694.\r
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[3] Haiwei Du, Yanqiu Huang*, Hongping Tang, Haina Qin, Wei Feng. Dielectric and piezoelectric properties of SrZrO3-modified (K0.45Na0.51Li0.04)(Nb0.90Ta0.04Sb0.06)O3 lead-free piezoceramics. Materials Letters, 106(2013)141－144.\r
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[4] Haiwei Du, Yanqiu Huang*, Huilin Li, Hongping Tang, Wei Feng. Effects of NaSbO3 on phase structure and electrical properties of K0.5Na0.5NbO3–LiTaO3–NaSbO3 piezoelectric ceramics. J. Mater. Sci: Mater. Electron., 2013, 24: 855－860.\r
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[5] Wei Feng, Yanqiu Huang*, Haiwei Du, Hongping Tang, Haina Qin. Microstructure and electrical properties of (1-x)K0.5Na0.5NbO3–x(Ba0.85Ca0.15)(Zr0.1Ti0.9)O3 lead-free piezoelectric ceramics. J. Mater. Sci.: Mater. Electron., 2013, 24: 3262－3268.\r
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[6] Yixiong Liu, Yanqiu Huang*, Huilin Li, Haiwei Du, Hongping Tang, Guoxi Zhang. Effects of NaTaO3 additions on structure and electrical properties of K0.5Na0.5NbO3–Bi0.5Na0.5TiO3–LiSbO3 piezoelectric ceramics. Ceramics International, 2011, 37: 1959－1965.\r
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[7] Yixiong Liu, Yanqiu Huang*, Haiwei Du, Huilin Li, Guoxi Zhang. Crystal structure and properties of K0.5Na0.5NbO3–Bi0.5Na0.5TiO3–LiSbO3 lead-free piezoelectric ceramics. Journal of Alloys and Compounds, 2010, 506: 407 －411.\r
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[8] Yanqiu Huang, Yixiong Liu, Lanfang Gao, Tiantian Liu, Guoxi Zhang. Dielectric and piezoelectric properties of (Bi,Na,Li)TiO3–Ba(Ti,Zr)O3 lead-free ceramics. Mater. Sci.: Mater. Electron., 2010, 21: 1055－1059.\r
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[9] Yixiong Liu, Yanqiu Huang*, Tiantian Liu, Bei Zhang, Qiushi Yan and Guoxi Zhang. Dielectric and piezoelectric properties of (1−x)(K0.498Na0.498Li0.04)NbO3–x(Bi0.5Na0.5)0.9Ba0.1(Zr0.0055Ti0.9945)O3 lead-free ceramics. Journal of Materials Science, 2010, 45(1): 188－191.\r
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[10] Lanfang Gao, Yanqiu Huang*, Liang Liu, Tiantian Liu, Chunfeng Liu, Fei Zhou, Xinwu Wan. Crystal structure and properties of BaTiO3-(Bi0.5Na0.5)TiO3 ceramic system. Journal of Materials Science, 2008, 43(18): 6267－6271.\r
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[11] Lanfang Gao, Yanqiu Huang*, Yan Hu, Hongyan Du. Dielectric and ferroelectric properties of (1-x)BaTiO3–xBi0.5Na0.5TiO3 ceramics. Ceramics International, 2007, 33: 1041－1046.\r
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[12] Yanqiu Huang, Lanfang Gao, Yan Hu, Hongyan Du. Compositional effects on the properties of (1-x)BaTiO3-xBi0.5Na0.5TiO3 ceramics. J. Materials Science: Materials in electronics, 2007, 18: 605－609.\r
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[13] Yanqiu Huang, Jinru Lin, Hongyan Du, Lanfang Gao, Yan Hu. Preparation and photoluminescence properties of ZnO/amorphous-BaTiO3 thin-films by sol–gel process. Materials Letters, 2006, 60: 3818－3821.\r
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[14] Yanqiu Huang, Meidong Liu, Yike Zeng, Churong Li. The effect of secondary phases on electrical properties of ZnO-based ceramic films prepared by a sol–gel method. J. Materials Science: Materials in electronics, 2004, 32: 549－553.\r
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[15] Yanqiu Huang, Meidong Liu, Zhen Li, Yike Zeng, Shaobo Liu. Raman spectroscopy study of ZnO-based ceramic films fabricated by novel sol-gel process. Materials Science and Engineering B, 2003, 97(2): 111－116.\r
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[16] Yanqiu Huang, Meidong Liu, Shenglin Jiang, Yike Zeng, Churong Li, Shaobo Liu, Dongxiang Zhou. Preparation and electrical properties of ZnO-glass ceramic films. Microelectronic Engineering, 2003, 66(1-4): 760－766.\r
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[17] Huang Yanqiu, Liu Meidong, Zeng Yike, Li Churong, Xia Donglin, Liu Shaobo. Preparation and properties of ZnO-based ceramic films for low-voltage varistors by novel sol-gel process. Materials Science and Engineering B, 2001, 86: 232－236.