周弘
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个人简介XidianUniversity(西安电子科技大学),微电子学院,中国,教授,2019.3-现在XidianUniversity(西安电子科技大学),微电子学院,中国,副教授,2018.3-2019.3UniversityofCaliforniaBerkeley(加州大学伯克利分校),电子工程,美国,博士后,2017-2018PurdueUniversity(普渡大学),电子工程,美国,博士,2012-2017NanyangTechnologicalUniversity(南洋理工),新加坡,助研2010-2012UESTC(电子科技大学),中国,本科,微电子技术,2006-2010科研团队先进半导体器件研究课题组,隶属郝跃院士以及张进成教授课题组,主要从事新型半导体器件研究。招生要求每年拟招收2名优秀博士生及5名优秀研究生从事半导体器件的研究探索。研究领域
1.GaNHEMTandMOSHEMT:DCandRFPowerdevice2.ALDDielectricEngineering3.Negative-CapacitanceField-EffectTransistors4.Ga2O3MOSFET5.SemiconductorDeviceFabricationandCharacterization近期论文
2020年:1.Demonstrationofa2kVAl0.85Ga0.15NSchottkyBarrierDiodewithImprovedOn-currentandIdealityFactorYanniZhang,JinchengZhang*,ZhihongLiu,ShengruiXu,KaiCheng,JingNing,ChunfuZhang,LeiZhang,PeijunMa,HongZhou*,andYueHaoIEEEElectronDeviceLetters,vol.41,no.3,pp.457-460,2020.2.Normally-offβ-Ga2O3PowerMOSFETwithFerroelectricChargeStorageGateStackStructureZhaoqingFeng,XushengTian,ZheLi,ZhuangzhuangHu,YanniZhang,XuanwuKang,JingNing,YachaoZhang,ChunfuZhang,QianFeng*,HongZhou*,JinchengZhang*,andYueHaoIEEEElectronDeviceLetters,vol.41,no.3,pp.333-336,2020.3.BeveledFluoridePlasmaTreatmentforVerticalβ-Ga2O3SchottkyBarrierDiodeWithHighReverseBlockingVoltageandLowTurn-OnVoltageZhuangzhuangHu,YuanjieLv,ChunyongZhao,QianFeng,ZhaoqingFeng,KuiDang,XushengTian,YachaoZhang,JingNing,HongZhou,XuanwuKang,JinchengZhang,andYueHaoIEEEElectronDeviceLetters,vol.41,no.3,pp.441-444,2020.4.Lateralβ-Ga2O3MOSFETswithHighPowerFigureofMeritof277MW/cm2YuanjieLv,HongyuLiu,XingyeZhou,YuangangWang,XuboSong,YuncongCai,QinglongYan,ChenluWang,ShixiongLiang,JinchengZhang,ZhihongFeng,HongZhou*,ShujunCai*,andYueHaoIEEEElectronDeviceLetters,vol.41,no.4,pp.537-540,2020.5.LeakageCurrentMechanismsofGroove-TypeTungsten-AnodeGaNSBDswithUltraLowTurn-ONVoltageandLowReverseCurrentYanniZhang,JinchengZhang*,HongZhou*,TaoZhang,HaiyongWang,ZhaoqingFeng,andYueHaoSolidStateElectronics,vol.169,pp.1-7,20202019年:1.High-Voltageβ-Ga2O3SchottkyDiodewithArgon-ImplantedEdgeTerminationYangyangGao,AngLi,QianFeng*,ZhuangzhuangHu,ZhaoqingFeng,KeZhang,XiaoliLu,ChunfuZhang,HongZhou,WenxiangMu,ZhitaiJia,JinchengZhang*,YueHaoNanoscaleresearchletters,vol.14,no.1,pp.8,2019.2.ExperimentalandTheoreticalStudiesofMo/AuSchottkyContactonMechanicallyExfoliatedβ-Ga2O3ThinFilmZhuangzhuangHu,QianFeng*,ZhaoqingFeng,YuncongCai,YixianShen,GuangshuoYan,XiaoliLu,ChunfuZhang,HongZhou,JinchengZhang*,YueHaoNanoscaleresearchletters,vol.14,no.1,pp.7,2019.3.Areviewofthemostrecentprogressesofstate-of-artgalliumoxidepowerdevices(InvitedReview)HongZhou,JinchengZhang*,ChunfuZhang,QianFeng,ShengleiZhao,PeijunMa,YueHaoJournalofSemiconductors,pp.1-18,2019.4.HighperformanceLateralGaNSchottkyBarrierDiodeonSiliconSubstratewithLowTurn-onVoltageof0.31V,HighBreakdownVoltageof2.65kVandHighPowerFigure-of-Meritof2.65GW/cm2TaoZhang,JinchengZhang*,HongZhou*,YachaoZhang,TangshengChen,KaiZhang,YiWang,KuiDang,ZhaokeBian,XiaolingDuan,JingNing,ShengleiZhao,andYueHaoAppliedPhysicsExpress,Vol.12,pp.046502,2019.5.A>3kV/2.94mΩ•cm2andLowLeakageCurrentwithLowTurn-onVoltageLateralGaNSchottkyBarrierDiodeonSiliconSubstratewithAnodeEngineeringTechniqueTaoZhang,JinchengZhang*,HongZhou*,YiWang,TangshengChen,KaiZhang,YachaoZhang,KuiDang,ZhaokeBian,JinfengZhang,ShengruiXu,XiaolingDuan,JingNing,andYueHaoIEEEElectronDeviceLetters,Vol.40,no.10,pp.1583-1586,2019.6.LateralGaNSchottkyBarrierDiodeforWirelessHigh-powerTransferApplicationwithHighRF/DCConversionEfficiency:FromCircuitConstructionandDeviceTechnologiestoSystemDemonstrationKuiDang,JinchengZhang*,HongZhou*,ShanYing,TaoZhang,JingNing,YachaoZhang,ZhaokeBian,JiaboChen,XiaolingDuan,ShengleiZhao,YueHaoIEEETransactiononIndustrialElectronics,Vol.xx,pp.xx,2019.7.A5.8GHzHigh-powerandHigh-efficiencyRectifierCircuitwithLateralGaNSchottkyDiodeforWirelessPowerTransferKuiDang,JinchengZhang*,HongZhou*,SenHuang,TaoZhang,ZhaokeBian,YachaoZhang,XinhuaWang,ShengleiZhao,KeWei,andYueHaoIEEETransactiononPowerElectronics(Letter),Vol.35,no.3,2019.8.High-PerformanceVerticalβ-Ga2O3SchottkyBarrierDiodewithImplantedEdgeTerminationHongZhou,QinglongYan,JinchengZhang*,YuanjieLv,ZhihongLiu,YanniZhang,KuiDang,PengfeiDong,ZhaoqingFeng,QianFeng,JingNing,ChunfuZhang,PeijunMaandYueHaoIEEEElectronDeviceLetters,Vol.40,no.11,pp.1788-1791,2019.9.A800Vβ-Ga2O3Metal-Oxide-SemiconductorField-EffectTransistorwithHigh-PowerFigureofMeritofOver86.3MW/cm2Z.Feng,Y.Cai,G.Yan,Z.Hu,K.Dang,Y.Zhang,Z.Lu,H.Cheng,X.Lian,Y.Xu,C.Zhang,Q.Feng*,H.Zhou*,J.Zhang*andY.HaoPhys.StatusSolidiA-Appl.Mat.,vol.216,pp.1900421-1-1900421-6,2019.2018年:1.InvestigationoftemperaturedependentelectricalcharacteristicsonAu/Ni/β-Ga2O3SchottkydiodesAngLi,QianFeng,JinchengZhang,ZhuangzhuangHu,ZhaoqingFeng,KeZhang,ChunfuZhang,HongZhou,andYueHaoSuperlatticesandMicrostructures,vol.119,pp.212-217,2018.2.High-performancequasi-verticalGaNSchottkydiodewithlowturn-onvoltageZhao-KeBian,HongZhou,Sheng-RuiXu,TaoZhang,KuiDang,Jia-BoChen,Jin-ChengZhang,YueHaoSuperlatticesandMicrostructures,vol.125,pp.295-301,2018.3.IntegrationandElectricalPropertiesofFerroelectricHf0.5Zr0.5O2ThinFilmonBulk-Ga2O3(−201)SubstrateforMemoryApplicationsWenwuXiao,YuePeng,ShuaizhiZheng,QianFeng,HongZhou,ChunfuZhang,JinchengZhang,YueHao,MinLiao,YichunZhouIEEEElectronDeviceLetters,vol.39,no.10,pp.1504-1507,2018.4.Tin-assistedgrowthofε-Ga2O3filmandthefabricationofphotodetectorsonsapphiresubstratebyPLDYuncongCai,KeZhang,QianFeng,YanZuo,ZhuangzhuangHu,ZhaoqingFeng,HongZhou,XiaoliLu,ChunfuZhang,WeihuaTang,JinchengZhang,YueHaoOpticalMaterialsExpress,vol.8,no.11,pp.3506-3517,2018.5.Field-PlatedLateralβ-Ga2O3SchottkyBarrierDiodewithHighReverseBlockingVoltageofMoreThan3kVandHighDCPowerFigure-of-Meritof500MW/cm2ZhuangzhuangHu,HongZhou*,QianFeng*,JinchengZhang*,ChunfuZhang,KuiDang,YuncongCai,ZhaoqingFeng,YangyangGaO,XuanwuKang,andYueHaoIEEEElectronDeviceLetters,vol.39,no.11,pp.1564-1567,2018.6.A1.9kV/2.61mΩ·cm2LateralGaNSchottkyBarrierDiodeonSiliconSubstratewithTungstenAnodeandLowTurn-OnVoltageof0.35VTaoZhang,JinchengZhang*,HongZhou*,TangshengChen,KaiZhang,ZhuangzhuangHu,ZhaokeBian,KuiDang,YiWang,LiZhang,JingNing,PeijunMa,YueHaoIEEEElectronDeviceLetters,vol.39,no.10,pp.1548-1551,2018.7.Lateralβ-Ga2O3SchottkyBarrierDiodeonSapphireSubstrateWithReverseBlockingVoltageof1.7kVZhuangzhuangHu,HongZhou*,KuiDang,YuncongCai,ZhaoqingFeng,QianFeng,JinchengZhang*,YueHao,IEEEJournaloftheElectronDevicesSociety,vol.6,pp.815-820,2018.8.AlGaN-ChannelGateInjectionTransistoronSiliconSubstratewithAdjustable4Vto7VThresholdVoltageand1.3kVBreakdownVoltageLiZhang,HongZhou*,WeihangZhang,KuiDang,Taozhang,PeijunMa,XiaohuaMa,JinchengZhang*,andYueHao,IEEEElectronDeviceLetters,vol.39,no.7,pp.1026-1029,2018.加入西电前:Journals:(1)HongZhou,KerryMaize,JinhyunNoh,AliShakouri,andPeideD.Ye,“Thermo-dynamicStudiesofβ-Ga2O3Nano-membraneField-effectTransistorsonDifferentSubstrates”,ACSOmega,vol.2,pp.7723-7729,2017.(2)HongZhou,XiabingLou,KartnnSutherlin,JarrenSummers,KelsonD.Chabak,RoyG.GordonandPeideD.Ye,“DCandRFperformanceofAlGaN/GaNMOSHEMTswithdeepsub-micronT-gatesandatomiclayerepitaxyMgCaOasgatedielectric”,IEEEElectronDeviceLetters,vol.38,pp.1294-1297,2017.(3)HongZhou,XiabingLou,SangBokKim,KelsonD.Chabak,RoyG.GordonandPeideD.Ye,“Enhancement-ModeAlGaN/GaNfin-MOSHEMTsonSiSubstratewithAtomicLayerEpitaxyMgCaO”,IEEEElectronDeviceLetters,vol.38,pp.1294-1297,2017.(4)HongZhou,KerryMaize,GangQiu,AliShakouri,andPeideD.Ye,“β-Ga2O3onInsulatorField-effectTransistorswithDrainCurrentsExceeding1.5A/mmandTheirSelf-heatingEffect”,AppliedPhysicsLetters,vol.111,pp.092102-1-092102-4,2017.(5)HongZhou,MengweiSi,SamiAlghamdi,GangQiu,LingmingYang,andPeideD.Ye,“HighPerformanceDepletion/Enhancement-Modeβ-Ga2O3onInsulator(GOOI)Field-effectTransistorswithRecordDrainCurrentsof600/450mA/mm”,IEEEElectronDeviceLetters,vol.38,pp.103-105,2017.(6)HongZhou,SamiAlghamdi,MengweiSi,GangQiu,andPeideD.Ye,“Al2O3/(-201)β-Ga2O3InterfaceImprovementthroughPiranhaPretreatmentandPostDepositionAnnealing”,IEEEElectronDeviceLetters,vol.37,pp.1411-1414,Oct.2016.(7)HongZhou,XiabingLou,NathanJ.Conrad,MengweiSi,HengWu,SamiAlghamdi,ShipingGuo,RoyG.Gordon,PeideD.Ye,“High-PerformanceInAlN/GaNMOSHEMTsEnabledbyAtomicLayerEpitaxyMgCaOasGateDielectric”,IEEEElectronDeviceLetters,vol.37,no.5,pp.556-559,May2016.(8)HongZhou,YuchenDu,andPeideD.Ye,“IonicliquidgatingonatomiclayerdepositionpassivatedGaN:Ultra-highelectrondensityinducedhighdraincurrentandlowcontactresistance”,AppliedPhysicsLetters,vol.108,pp.202102-1-202102-5,May2016.(9)HongZhou,GeokIngNg,ZhiHongLiu,andSubranmaniamArulkumaran,“Side-gateeffectsonthedirectcurrentandradiofrequencycharacteristicsofAlGaN/GaNhigh-electron-mobilitytransistoronsilicon”,AppliedPhysicsLetters,vol.99,pp.163505-1-163505-3,Oct.2011.(10)HongZhou,GeokIngNg,ZhiHongLiu,andSubranmaniamArulkumaran,“ImprovedDevicePerformancebyPost-OxideAnnealinginALDAl2O3/AlGaN/GaNMetal-Insulator-SemiconductorHighElectronMobilityTransistoronSi”,AppliedPhysicsExpress,vol.4,pp.104102-1-104102-3,Sep.2011.(11)HongZhou,MengweiSi,JinhyunNoh,KerryMaize,S.B.Kim,RoyGordon,AliShakouri,PeideD.Ye,“HystersisFreeNegativeCapacitanceHf0.5Zr0.5O2/Mg0.25Ca0.75O/AlGaN/GaNMOSHEMTsonSiSubstratewithDual-SweepSubthresholdSwing<60mV/dec”,IEEEElectronDeviceLetters,2017.(Submitted)(12)Sung-JaeChang,HongZhou,NanboGong,DongminKang,JongwonLim,MengweiSi,PeideD.Ye,T.P.Ma,“Fin-widthEffectsonCharacteristicsofInGaAs-BasedVerticalIndependentDouble-GateTransistor”,IEEEElectronDeviceLetters,vol.38,pp.441-444,2017.(13)M.Si,C.J.Su,C.Jiang,N.J.Conrad,H.Zhou,K.D.Maize,G.Qiu,C.T.Wu,A.Shakouri,P.D.Ye,“SteepSlopeMoS22DTransistors:NegativeCapacitanceandNegativeDifferentialResistance”,NatureNanotechnology,vol.13,no.1,pp.24-30,2018..(14)MengweiSi,LingmingYang,HongZhou,PeideD.Ye,“β-Ga2O3Nano-membraneNegativeCapacitanceField-effectTransistorwithSteepSubthresholdSlopeforWideBandgapLogicApplications”,ACSOmega,vol.2,pp.7136-7140,2017.(15)Jing-KaiQin,GangQiu,JieJian,HongZhou,Ling-MingYang,Cheng-YanXu,Hai-YanWang,andPeideD.Ye,“ControlledGrowthofLarge-Size2DSeleneneandItsElectronicandOptoelectronicApplications”,ACSNano,vol.11,pp.10222-10229,2017.(16)MarufA.Bhuiyan,HongZhou,S.J.Chang,XiabingLou,XianGong,RongJiang,HuiqiGong,EnXiaZhang,C.H.Won,J.W.Lim,J.H.Lee,RoyG.Gordon,RobertA.Reed,D.M.Fleetwood,PeideYe,andT.P.Ma,“TotalIonizingDoseResponsesofGaN-basedHEMTswithDifferentChannelThicknessesandMOSHEMTswithEpitaxialMgCaOasGateDielectric”,IEEETransactionsonNuclearScience,vol.65,No.1,46-52,2018.(17)XiabingLou,HongZhou,SangBokKim,SamiAlghamdi,XianGong,JunFeng,PeideD.Ye,RoyG.Gordon,“EpitaxialGrowthofMgCaOonGaNbyAtomicLayerDeposition”,NanoLetters,vol.16,pp.7650-7654,2016.(18)GangQiu,YuchenDu,AdamCharnas,HongZhou,ShengyuJin,ZheLuo,DmitryZemlyanov,XianfanXu,GaryCheng,PeideD.Ye,“ObservationofOpticalandElectricalIn-planeAnisotropyinHigh-mobilityFew-layerZrTe5”,NanoLetters,vol.16,pp.7364-7369,2016.(19)YuchenDu,AdamT.Neal,HongZhouandPeideD.Ye,“WeakLocalizationinFew-LayerBlackPhosphorus”,2DMaterials,vol.3,pp.024003,Mar.2016.(20)YuchenDu,LingmingYang,HongZhouandPeideD.Ye,“PerformanceEnhancementofBlackPhosphorusField-EffectTransistorsbyChemicalDoping”,IEEEElectronDeviceLetters,vol.37,pp.429-432,Mar.2016.(21)YuchenDu,AdamT.Neal,HongZhouandPeideD.Ye,“Transportstudiesin2Dtransitionmetaldichalcogenidesandblackphosphorus”,J.ofPhysics:CondensedMatter,vol.28,pp.263002,May2016.(22)ZhihongLiu,GeokIngNg,HongZhou,SubranmaniamArulkumaran,“ReducedsurfaceleakagecurrentandtrappingeffectsinAlGaN/GaNhighelectronmobilitytransistorsonsiliconwithSiN/Al2O3passivation”,AppliedPhysicsLetters,vol.98,pp.113506-1-113506-3,Oct.2011.(23)ZhihongLiu,GeokIngNg,SubranmaniamArulkumaran,YrikleterraManung,HongZhou,“Temperature-dependentforwardgatecurrenttransportinALDAl2O3/AlGaN/GaNmetal-insulator-semiconductorhighelectronmobilitytransistor”,AppliedPhysicsLetters,vol.98,pp.163105-1-163105-3,April2011.(24)DaewoongKwon,KorokChatterjee,AvaJTan,AjayKYadav,HongZhou,AngadaBSachid,RobertoDosReis,ChenmingHu,SayeefSalahuddin,“ImprovedSubthresholdSwingandShortChannelEffectinFDSOIn-ChannelNegativeCapacitanceFieldEffectTransistors”,IEEEElectronDeviceLetters,vol.39,no.2,pp.300-303,Jan.2018.Conferences:(1)HongZhou,DaewoongKwon,AngadaB.Sachid,YuhungLiao,KorokChatterjee,AvaJ.Tan,AjayK.Yadav,ChenmingHu,andSayeefSalahuddin,\ 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