个人简历
學歷：國立清華大學物理研究所博士 開設課程：X光光學與同步輻射光束線設計
研究领域
Ｘ光物理及光學分析""
近期论文
•S.W.Luh, M.-T.Tang and S.L.Chang, (1987),”Derivation of the Non-Negative Karle-Hauptman Determinat from the Dynamical Theory of X-ray Diffraction.”, Chinese J. Physics, 25, 251-259. •S.L.Chang, H.H.Horng, S.W.Luh, M.-T.Tang, (1987), “Phase Determination of Structure-Factor Triplets and Quartets Using High-Order Multiple Diffraction of X-rays.”, Acta Cryst., A43, C283. •S.L.Chang, H.H.Hung, S.W.Luh, H.H.Pan, M.-T.Tang and M.Sasaki, (1987), “Phase Determination Using High-Order Multiple Diffraction of X-rays.”, Acta Cryst., A44, 63-70. •S.L.Chang and M.-T.Tang, (1988), “Quantitative Determination of Phases of X-ray Reflection from Three-Beam Diffraction. I. Theoretical Considerations.”, Acta Cryst., A44, 1065-1072. •M.-T.Tang and S.L.Chang, (1988), “Quantitative Determination of Phases of X-ray Reflection from Three-Beam Diffraction. II. Experiments for Perfect Crystals.”, Acta Cryst., A44, 1073-1078. •S.L.Chang, M.T.Huang, M.-T.Tang and C.H.Lee, (1989), “Quantitative Determination of Phases of X-ray Reflection from Three-Beam Diffraction. III. Experiments on Mosaic Crystals.”, Acta Cryst., A45, 870-878. •S.S.Chien, M.T.Tang and S.L.Chang, (1989), “Determination of the Enantiomorph from Intensity Measurements of Three-Beam Bragg-Surface Difraction of X-rays.”, Acta Cryst., A45, 703-708. •M.-T.Tang and S.L.Chang, (1990), “Kramers-Kronig Relations in Three-Beam X-ray Diffraction: Application to Phase Determination.”, Physics Letters, A143, 405-408. •S.L.Chang, M.T.Huang and M.-T.Tang, (1990), “Quantitative Phase Determination and Kramers-Kronig Relations in Three-Beam X-ray Diffraction.”, Acta Cryst., A46, C416. •F.J.Lamelas, M.-T.Tang and K.W.Evans-Lutterodt, (1992), “Epitaxial Orientation of Aluminum on Silicon(001).”, Phys. Rev., B46, 15570-15573. •M.-T.Tang and K.W.Evans-Lutterodt, G.S.Higashi and T.Boone, (1993), “Roughness of the Silicon(001)/SiO2 Interface.”, Appl. Phys. Lett., 62, 3144-3146. •M.-T.Tang, K.W.Evans-Lutterodt, M.L.Green, D.Brasen, K.Krisch, L.Manchanda, G.S.Higashi and T.Boone, (1994), “Growth Temperature Dependence of the Si(001)/SiO2 Interface Width.”, Appl. Phys. Lett., 64, 748-750. •M.L.Green, D.Brasen, K.W.Evans-Lutterodt, L.C.Feldman, K.Krisch, W.Lennard, H.T.Tang, L.Manchanda and M.-T.Tang, (1994), “Rapid Thermal Oxidation of Silicon in N2O Between 800 and 1200C: Incorporated Nitrogen and Interfacial Roughness.”, Appl. Phys. Lett., 65, 848-850. •K.W.Evans-Lutterodt and M.-T.Tang, (1995), “Angle Calculation for a ‘2+2’ Surface X-ray Diffractometer.”, J. of Appl. Cryst., 28 318-323. •J.L.Dawson, K.Krisch, K.W.Evans-Lutterodt, M.-T.Tang, L.Manchanda, M.L.Green, D.Brasen, H.S.Higashi and T.Boone, (1995), “Kinetic Smoothening: Growth Thickness Dependence of the Interface Width of the Si(001)/SiO2 Interface.”, J. Appl. Phys., 77,4746. •S.T.Cundiff, W.H.Knox, F.H.Baumann, K.W.Evans-Lutterodt, M.-T.Tang, M.L.Green and H.M. van Driel, (1997), “Si/SiO2 interface roughness: comparison between surface second harmonic generation and X-ray scattering.”, Appl. Phys. Lett., 70, 1414-1416. •C.H.Hsu and M.-T.Tang, (1998), “The Surface X-ray Scattering System at SRRC”, J. of Synchrotron Radiation, 5, 896-898. •S.L.Chang, Y.S.Huang, C.H.Chao, M.-T.Tang and Y.P.Stetsko, (1998), “ Three-wave Resonance Grazing Incidence X-ray Diffractioin: A Novel Method for Direct Phase Determination of Surface in-plane Reflections.”, Phys. Rev. Lett., 80, 301-304. •M.-T. Tang, T.E. Dann, C.C. Chen, K.L.Tsang, C.T.Chen, K.S.Liang, (2001), “Design of the Taiwan Contract Bending Magnet Beamline at SPring-8”, Nucl. Instrum. Meth. A467-468, 719-722.•J.-F. Lee, M.-T. Tang, W.-C. Shih, and R.-S. Liu, (2002), “Ce K-edge EXAFS Study of Nanocrystalline CeO2”, Materials Research Bulletin\
