热点话题人物,欢迎提交收录!
最优雅的名人百科,欢迎向我们提交收录。
张巧珍
2023-05-12 22:20
  • 张巧珍
  • 张巧珍 - 讲师-上海师范大学-信息与机电工程学院-个人资料

近期热点

资料介绍

研究领域


压电薄膜微声器件的建模与仿真
声表面波器件与传感技术及系统

近期论文


(1)QiaozhenZhang,TaoHan,JingChen,WeibiaoWang,Ken-yaHashimoto,EnhancedCouplingFactorofSurfaceAcousticWaveDevicesEmployingScAlN/DiamondLayeredStructurewithEmbeddedElectrodes,DiamondandRelatedMaterials,2015,58(9):31-34
(2)QiaozhenZhang,TaoHan,GongbinTang,JingChen,Ken-yaHashimoto,SAWCharacteristicsofAlN/SiO2/3C-SiCLayeredStructurewithEmbeddedElectrodes,IEEETransactionsonUltrasonics,Ferroelectrics,andFrequencyControl,2016,63(10):1608~1612
(3)QiaozhenZhang,Jiaqiguo,TaoHan,BenfengZhang,GongbinTang,Ken-yaHashimoto,WaveDomainAnalysisofSurfaceAcousticWavesScatteringfromLocalizedGratingsonLayeredPiezoelectricSubstrate,Ultrasonics,2018,88:131-136
(4)JingChen,QiaozhenZhang,TaoHan,LiuZhou,GongbinTang,BoquanLiu,andXiaojunJi,TheoreticalAnalysisofSurfaceAcousticWavePropagatingPropertiesofY-cutNanoLithiumNiobateFilmonSiliconDioxide,AIPAdvances5,2015,087173:1-5
(5)GongbinTang,TaoHan,QiaozhenZhang,KentaYamazaki,TatsuyaOmori,Ken-yaHashimoto,ValidityEvaluationofScxAl1−xNMaterialConstantsBasedonSAWCharacteristics,JournalofMicromechanicsandMicroengineering,26(11),115002(6pp),2016.
(6)QiaozhenZhang,TaoHan,BenfengZhang,GongbinTang,YulinHuang,TatsuyaOmori,Ken-yaHashimoto,FrequencyDomainFEMAnalysisofReflectorScatteringCharacteristicsforSAWTags,2016IEEEInternationalUltrasonicsSymposium,Tours,France,2016/9/18-2016/9/21.
(7)QiaozhenZhang,TaoHan,GongbinTang,JinChen,KenyaHashimoto,SAWCharacteristicsofAlN/SiO2/3C-SiCLayeredStructurewithEmbeddedElectrodes,IEEEInternationalUltrasonicsSymposium,Taipei,Taiwan,2015/10/21-2015/10/24.
(8)QiaozhenZhang,TaoHan,Wei-biaoWang,Ken-yaHashimoto,JingChen,SurfaceAcousticWavePropagationCharacteristicsofScAlN/DiamondStructurewithBuriedElectrodes,2014SymposiumonPiezoelectricity,Acousticwaves,andDeviceApplications,Beijing,P.R.China,2014/10/30-2014/11/2.
(9)张巧珍,王为标,韩韬,陈景,基于COMSOL的声表面波温度特性建模仿真,第13届全国敏感元件与传感器学术会议,太原,中国,2014/10/11-2014/10/13.
(10)韩韬,魏书柳,张巧珍,适用于超声共振谱法测薄膜材料常数的试样及测试方法,2016/8/10,上海,中华人民共和国国家知识产权局,201610651486.4.

相关热点

扫码添加好友