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靳松
2023-05-10 15:45
  • 靳松
  • 靳松 - 副教授 硕导-华北电力大学(保定)-电子与通信工程系-个人资料

近期热点

资料介绍

个人简历


以负责人身份主持国家自然科学基金一项,河北省自然科学基金一项,中央高校基本科研业务费专项资金资助重点项目一项、面上项目一项。已公开出版学术专著一部,发表三十余篇学术论文,获得两项国家发明专利授权。

研究领域


大规模集成电路设计;电路级和体系结构级可靠性设计与容错计算;大数据分析与分布式计算"主要项目:
1.参数偏差影响下三维多核芯片的系统性能优化。国家自然科学基金项目,项目号:61204027;
2.参数偏差影响下三维嵌入式多核芯片能耗管理与优化研究。河北省自然科学基金项目,项目号:,F2013502274;
3.偏差感知的多处理器片上系统性能良品率统计分析与优化方法研究。中央高校基本科研业务费专项资金资助重点项目,项目号:2014ZD32."

近期论文


1.Song Jin, Songwei Pei, Yinhe Han, Huawei Li. A cost effective energy optimization framework of multi-core SoCs based on dynamically reconfigurable voltage-frequency islands. ACM Transactions on Design Automation of Electronic Systems (TODAES), 2016, 21(2):1-14.
2.Song Jin, Yinhe Han, Songwei Pei. Statistical energy optimization on voltage–frequency island based MPSoCs in the presence of process variations. Microelectronics Journal, 2016, 54:23-31.
3.Song Jin, Yu Wang and Tongna Liu. On optimizing system energy of voltage-frequency island based 3-D multi-core SoCs under thermal constraints. Integration, the VLSI Journal, 2015, 48(1):36-45.
4.Song Jin, Yinhe Han, Huawei Li, Xiaowei Li. Unified capture scheme for small delay defect detection and aging prediction. IEEE Transactions on Very Large Scale Integration Systems (VLSI), 2013, 21(5):821-833.
5.Song Jin, Yinhe Han. M-IVC: Applying multiple input vectors to co-optimize aging and leakage. Microelectronics Journal,2012, 43(11):838-847.
6.Song Jin,Yinhe Han,Huawei Li,Xiaowei Li. Statistical lifetime reliability optimization considering joint effect of process variation and aging. Integration, the VLSI journal,2011, 44(3):185-191.
7.靳松, 韩银和, 王瑜. 面向三维多核片上系统的热感知硅后能耗优化方法. 计算机学报, 2016, 39(9):1763-1774.
8.靳松,韩银和,李华伟,李晓维. 一种考虑工作负载的电路老化预测方法. 计算机辅助设计与图形学学报. 2010, 22(12):2242-2249.
9.Song Jin, Yinhe Han, Songwei Pei. Variation-aware statistical energy optimization on voltage-frequency island based MPSoCs under performance yield constraints. IEEE Asia and South Pacific Design Automation Conference (ASP-DAC), 2014:720-725.
10.Yinhe Han, Song Jin, Jibing Qiu, Qiang Xu. On predicting NBTI-induced circuit aging by isolating leakage change. IEEE International Symposium on Quality Electronic Design (ISQED), 2013:46-52.
学术专著:
靳松,韩银和. 纳米数字集成电路老化效应-分析、预测及优化. 《清华大学出版社》, 2012年6月.

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