个人简历
电子科技大学光电信息学院教授，分别于1985、1988和1995年获得学士、硕士和博士学位，中国科学院光电技术研究所客座研究员，中国科学院引进国外杰出人才类“百人计划”入选者（终期评估“优秀”），四川省学术和技术带头人，国际标准化组织（ISO）TC 172/SC 9/WG 6专家组成员，第14-19届国际光声光热大会国际顾问或技术委员会委员，第17届国际光声光热大会共主席，美国光学学会2013、2016年光学干涉薄膜系列国际会议技术委员会委员，高功率激光系统与应用系列国际会议顾问委员会委员，中国科学院大学（研究生院）第三届学位委员会学科群学位分委员会（材料科学与光电技术）委员和光学工程学科教学专家组成员，全国光辐射安全和激光设备标准化技术委员会委员，全国光学与光子学标准化委员会电子光学系统分委会委员。2007年获得国际光声光热联合会（IPPA）青年成就奖，2011年被评为国家863技术“十一五”先进个人，2012年获中国科学院王宽诚西部学者突出贡献奖。先后主持国家科技重大专项、国家重大科研装备自主创新试点项目、国家863计划项目、国家自然科学基金项目、中国科学院科研装备研制项目、中国科学院“百人计划”择优支持项目等项目二十余项，在国内外主要学术期刊和国际学术会议上发表学术论文200余篇。其中SCI收录论文110篇。作为项目负责人及撰写人制定国际标准1项（ISO 13142）。
研究领域
光学检测技术、激光光谱痕量气体检测、激光技术与应用
近期论文
(1) Xiaorong Zhang and Bincheng Li*, Sensitivity enhancement of surface thermal lens technique with a short-wavelength probe beam: Experiment, Rev. Sci. Instrum., 2015, 86(2): 024902 (2) Xiaorong Zhang and Bincheng Li*, Calibration optimization of laser-induced deflection signal for measuring absorptance of laser components, Appl. Opt. , 2015, 54(8):1861-1869 (3) Cunding Liu, Mingdong Kong, and Bincheng Li*, Anomalous optical Anderson localization in mixed one dimensional photonic quasicrystals, Opt. Express, 2015, 23(19): A1297 (4) Chun Guo, Mingdong Kong, Dawei Lin, and Bincheng Li*, Fluoride coatings for vacuum ultraviolet reflection filters, Appl. Opt., 2015, 54(35): 10498 (5) Qian Wang and Bincheng Li*, Electronic transport characterization of silicon wafers by spatially resolved steady-state photocarrier radiometric imaging, J. Appl. Phys., 2015, 118(12): 125705 (6) Qian Wang and Bincheng Li*, Accurate determination of electronic transport properties of silicon wafers by nonlinear photocarrier radiometry with multiple pump beam sizes, J. Appl. Phys., 2015, 118(21):215707 (7) Bincheng Li*, Hao Cai, Yanling Han, Lifeng Gao, Chunming Gao, and Yafei Wang, Simultaneous determination of optical loss, residual reflectance and transmittance of highly anti-reflective coatings with cavity ring down technique, Opt. Express, 2014, 22(23): 29135-29142 (8) Cunding Liu, Mingdong Kong, and Bincheng Li*, Tamm plasmon-polariton with negative group velocity induced by a negative index meta-material capping layer at metal-Bragg reflector interface, Opt. Express, 2014, 22(9):11376-11383 (9) Chun Guo, Mingdong Kong, Weidong Gao, and Bincheng Li*, Simultaneous determination of optical constants, thickness, and surface roughness of thin film from spectrophotometric measurements, Opt. Lett., 2013, 38(1) :40-42 (10) Chun Guo, Mingdong Kong, Dawei Lin, Cunding Liu, and Bincheng Li*, Microstructure-related properties of magnesium fluoride films at 193nm by oblique-angle deposition, Opt. Express, 2013, 21(1): 960 (11) Hongyu Zu, Bincheng Li*, Yanling Han, and Lifeng Gao, Combined cavity ring-down and spectrophotometry for measuring reflectance of optical laser components, Opt. Express, 2013, 21(22): 26735 (12) Chun Guo, Mingdong Kong, Cunding Liu, and Bincheng Li*, Optimization of thickness uniformity of optical coatings on a conical substrate in a planetary rotation system, Appl. Opt., 2013, 52(4):B26 (13) Weijing Liu and Bincheng Li*, Repetition rate dependence of absorption of fused silica irradiated at 193 nm, Chin. Opt. Lett., 2013, 11(5):053002 (14) Shengdong Ren, Bincheng Li*, and Qiuping Huang, Three-dimensional transient model for time-domain free-carrier absorption measurement of excess carriers in silicon wafers, J. Appl. Phys., 2013, 114(24): 243702 (15) Qiuping Huang, Bincheng Li*, and Shengdong Ren, Optical and photo-carrier characterization of ultra-shallow junctions in silicon, Sci. China-Phys. Mech. Astron., 2013, 56(7): 1294-1300 (16) Qiuping Huang and Bincheng Li*, Photocarrier radiometry of ion-implanted and thermally annealed silicon wafers with multiple-wavelength excitations, J. Appl. Phys., 2012, 111(9):093729 (17) Yanru Wang and Bincheng Li*, Accurate temperature model for absorptance determination of optical components with laser calorimetry, Appl. Opt., 2011, 50(9): C264
