个人简历

刘志伟于2010年8月获得美国中佛罗里达大学电子工程专业博士学位。目前是电子科技大学微电子与固体电子学院副教授。刘志伟在半导体器件静电保护方面有着将近10年的研究经验，曾经在美国ADI，Intersil等知名公司工作或实习，所开发的ESD保护方案在多家半导体公司的芯片上大规模生产，获得美国专利授权1项，中国国家发明专利1项。作为项目负责人承担国家自然科学基金青年基金，国家重点实验室开放基金以及多项横向合作项目。刘志伟的研究成果在国内外专业期刊上发表论文20余篇(包括EDL 3篇，TED 2篇)，翻译ESD相关专著1本。参加ICSICT2013和IEEE EDSSC 2013以及IEDMs 2014国际会议并做受邀报告。担任多家期刊(IEEE EDL, IEEE TED, Microelectronic Reliability)的评审，2013年被授予IEEE EDL金牌审稿人。作为IEEE EDS成都分会秘书，积极组织成都地区电子器件领域的学术交流活动。 教育背景 2005.09－2010.08 美国中佛罗里达大学，微电子器件，博士学位 2001.09－2003.06 华中科技大学，微电子科学与技术，硕士学位 1997.09－2001.06 华中科技大学，电子工程，学士学位 工作履历 2011-现在，电子科技大学微电子与固体电子学院，副教授 2010-2011，北京大学深圳SOC重点实验室，芯片ESD相关研究。 2003.07-2004.12，美国模拟器件公司(ADI)北京设计中心，任芯片设计工程师

研究领域

On Chip ESD protection design and simulation, semiconductor devices modeling, nano-devices.

近期论文

1. Fan Liu, Zhiwei Liu, Jizhi Liu, Hui Cheng, Liu Zhao, Rui Tian, Shiyu Song and Juin J. Liou, “A novel vertical SCR for ESD protection in 40V HV bipolar process”, Microelectronics Reliability, Vol.78, pp. 307-310, Nov. 2017 2. Yu Liu, Wen Huang, Tianxun Gong, Yue Su, Hua Zhang, Yiwen He, Zhiwei Liu and Bin Yu, “Ultra-sensitive near-infrared graphene photodetctors with nanopillar antennas”, Nanoscale, 2017, 9, 17459-17464 3. Bo Liu, Chia-Ming Yang, Zhiwei Liu and Chao-Sung Lai, “N-doped graphene with low intrinsic defect densities via a solid source dopoing technique”, Nanomaterials 2017, 7, 302 4. Xiaozong Huang, Zhiwei Liu, Fan Liu, Jizhi Liu and Wenqiang Song, “High holding voltage SCRs with segmented layout for high-robust ESD protection”, Electronics Letters, Vol. 53, pp. 1274-1275, No. 18, Aug. 2017 5. Liu Jizhi, Zeng Yaohui, Liu Zhiwei, Zhao Jianming, Cheng Hui and Liu Nie, “Low voltage triggering SCRs for ESD protection in a 0.35um SiGe BiCMOS process”, Microelectronics Reliability, Vol.73, pp. 122-128, June 2017 6. Liu Jizhi, Qian Lingli, Tian Rui, Liu Zhiwei, Zhao Liu and Cheng Hui, “Self-triggered stacked silicon-controlled rectifier structure (STSSCR) for on-chip electrostatic discharge (ESD) protection”, Microelectronics Reliability, Vol. 71, pp. 1-5, April 2017 7. Changjun Liao, Jizhi Liu and Zhiwei Liu, “New fast turn-on speed SCR device for electrostatic discharge protection”, Microelectronics Reliability, Vol. 66, pp. 38-45, Nov. 2016 8. Xiaozong Huang, Juin J. Liou, Zhiwei Liu, Fan Liu, Jizhi Liu and Hui Cheng, “A new high holding voltage dual-direction SCR with optimized segmented topology”, IEEE Electron Device Letters, Vol. 37, No. 10, pp 1311-1313, Oct. 2016 9. Yue Su, Zhongxun Guo, Wen Huang, Zhiwei Liu, Tianxun gong, Yiwen He and Bin Yu, “Ultra-sensitive graphene photodetector with plasmonic structure”, Applied Physics Letters, 109, 173107, 2016 10. Xiang Li,Wen Huang, Guang Yao, Min Gao, Xiongbang Wei, Zhiwei Liu, Hua Zhang, Tianxun Gong and Bin Yu “Highly sensitive flexible tactile sensors based on microstructured multiwall carbon nanotube arrays”, Scripta Materialia, Vol. 129, pp. 61-64, Sept. 2016 11. Linfeng He, Te-Kuang Chiang, Juin J. Liou, Wechao Zheng and Zhiwei Liu, “A new analytical subthreshold potential/current model for quadruple-gate junctionless MOSFET”, IEEE Transactions on Electron Devices, Vol. 61, No. 6, pp. 1972-1978, June 2014 12. Ze Jia, Gong Zhang, Jizhi Liu, Zhiwei Liu and Juin J. Liou, “Reference voltage generation scheme enhancing speed and reliability for 1T1C-type FRAM ”, Electronics Letter, Vol. 50, No. 3, pp.154-156, 2014 13. Shurong Dong, Meng Miao, Jian Wu, Jie Zeng, Zhiwei Liu and Juin J. Liou, “Low-capacitance SCR structure for RF I/O application”, IEEE Transactions on Electromagnetic Compatibility, Vol. 55, No. 2, pp. 241-247, April 2013 14. Zhiwei Liu, Juin J. Liou, Shurong Dong and Yan Han, “Silicon controlled rectifier stacking structure for high-voltage ESD protection applications”, IEEE Electron Device Letters, Vol. 31, No.8, pp.845-847, Aug. 2010 15. Zhiwei Liu, Juin J. Liou and Jim Vision, “Novel silicon-controlled rectifier (SCR) for high-voltage Electrostatic Discharge (ESD) applications”, IEEE Electron Device Letters, Vol. 29, No. 7, pp.753-755, July 2008 16. Zhiwei Liu, Jim Vison, Lifang Lou, Juin J. Liou, “An improved bidirectional SCR structure for low-triggering ESD protection applications”, IEEE Electron Device Letters, Vol. 29, No. 4, pp. 360-362, April 2008 17. Javier A. Salcedo, Juin J. Liou, Zhiwei Liu and James E. Vinson, “TCAD methodology for design of SCR devices for Electrostatic Discharge (ESD) applications”, IEEE Transactions on Electron Devices, Vol. 54, No. 4, pp. 822-832, April 2007